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Temperature mapping and thermal lensing in large-mode, high-power laser diodes
dc.contributor.authorChan, Paddy K. L.en_US
dc.contributor.authorPipe, Kevin P.en_US
dc.contributor.authorPlant, J. J.en_US
dc.contributor.authorSwint, R. B.en_US
dc.contributor.authorJuodawlkis, P. W.en_US
dc.date.accessioned2011-11-15T16:09:04Z
dc.date.available2011-11-15T16:09:04Z
dc.date.issued2006-11-13en_US
dc.identifier.citationChan, P. K. L.; Pipe, K. P.; Plant, J. J.; Swint, R. B.; Juodawlkis, P. W. (2006). "Temperature mapping and thermal lensing in large-mode, high-power laser diodes." Applied Physics Letters 89(20): 201110-201110-3. <http://hdl.handle.net/2027.42/87806>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87806
dc.description.abstractThe authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ = 1.55 μmλ=1.55μm InGaAsP/InPInGaAsP∕InP watt-class laser that has a large (>5×5 μm2)(>5×5μm2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleTemperature mapping and thermal lensing in large-mode, high-power laser diodesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumSolid State Thermal Physics Laboratory, University of Michigan, Ann Arbor, Michigan 48109-2025en_US
dc.contributor.affiliationotherLincoln Laboratory, Massachusetts Institute of Technology, Lexington, Massachusetts 02420-9108en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87806/2/201110_1.pdf
dc.identifier.doi10.1063/1.2388884en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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