Carrier-envelope phase stabilization of high-contrast femtosecond laser pulses with a relativistic intensity
dc.contributor.author | Hong, Kyung-Han | en_US |
dc.contributor.author | Lee, Jongmin | en_US |
dc.contributor.author | Hou, Bixue | en_US |
dc.contributor.author | Nees, John A. | en_US |
dc.contributor.author | Power, Erik P. | en_US |
dc.contributor.author | Mourou, Gerard A. | en_US |
dc.date.accessioned | 2011-11-15T16:09:20Z | |
dc.date.available | 2011-11-15T16:09:20Z | |
dc.date.issued | 2006-07-17 | en_US |
dc.identifier.citation | Hong, Kyung-Han; Lee, Jongmin; Hou, Bixue; Nees, John A.; Power, Erik; Mourou, Gerard A. (2006). "Carrier-envelope phase stabilization of high-contrast femtosecond laser pulses with a relativistic intensity." Applied Physics Letters 89(3): 031113-031113-3. <http://hdl.handle.net/2027.42/87818> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/87818 | |
dc.description.abstract | We report on the generation of carrier-envelope phase (CEP)-stabilized pulses with a relativistic intensity and a high-contrast ratio. The CEP stabilization is achieved with a jitter of 0.95 rad0.95rad from a 0.5 kHz0.5kHz femtosecond laser pulses with a focal intensity of 2.6×1018 W/cm22.6×1018W∕cm2 and a picosecond contrast of 2.5×10−92.5×10−9. CEP noise analysis shows that the beam pointing at the pulse compressor is a dominant factor of the CEP fluctuation with our laser system. | en_US |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Carrier-envelope phase stabilization of high-contrast femtosecond laser pulses with a relativistic intensity | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | FOCUS Center and Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, Michigan 48019 | en_US |
dc.contributor.affiliationother | Femto Science Laboratory, Advanced Photonics Research Institute (APRI), Gwangju Insitute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju 500-712, Republic of Korea | en_US |
dc.contributor.affiliationother | Laboratoire d’Optique Applique (LOA), Chemin de la Huniere, 91761 Palaiseau Cedex, France | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/87818/2/031113_1.pdf | |
dc.identifier.doi | 10.1063/1.2221877 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
dc.identifier.citedreference | A. Baltuska, Th. Udem, M. Uiberacker, M. Hentschel, E. Goulielmakis, Ch. Gohle, R. Holzwarth, V. S. Yakovlev, A. Scrinzi, T. W. Hansch, and F. Krausz, Nature (London) 421, 611 (2003). | en_US |
dc.identifier.citedreference | M. Drescher, M. Hentschel, R. Kienberger, M. Uiberacker, V. Yakovlev, A. Scrinzi, T. Westerwalbesloh, U. Kleineberg, U. Heinzmann, and F. Krausz, Nature (London) 419, 803 (2002). | en_US |
dc.identifier.citedreference | D. J. Jones, S. A. Diddams, J. K. Ranka, A. Stentz, R. S. Windeler, J. L. Hall, and S. T. Cundiff, Science 288, 635 (2000). | en_US |
dc.identifier.citedreference | Y. S. Lee, J. H. Sung, C. H. Nam, T. J. Yu, and K.-H. Hong, Opt. Express 13, 2969 (2005). | en_US |
dc.identifier.citedreference | A. Baltuska, M. Uiberacker, E. Goulielmakis, R. Kienberger, V. S. Yakovlev, Th. Udem, T. W. Hansch, and F. Krausz, IEEE J. Sel. Top. Quantum Electron. 9, 972 (2003). | en_US |
dc.identifier.citedreference | S. V. Bulanov, T. Esirkepov, and T. Tajima, Phys. Rev. Lett. 91, 085001 (2003). | en_US |
dc.identifier.citedreference | N. Naumova, J. A. Nees, I. V. Sokolov, B. Hou, and G. A. Mourou, Phys. Rev. Lett. 92, 063902 (2004). | en_US |
dc.identifier.citedreference | K. Lee, Y. Cha, M. Shin, B. Kim, and D. Kim, Opt. Express 11, 309 (2003). | en_US |
dc.identifier.citedreference | O. Albert, H. Wang, D. Liu, Z. Chang, and G. Mourou, Opt. Lett. 25, 1125 (2000). | en_US |
dc.identifier.citedreference | C. P. Hauri, W. Kornelis, F. W. Helbing, A. Heinrich, A. Couairon, A. Mysyrowicz, J. Beigert, and U. Keller, Appl. Phys. B: Lasers Opt. 79, 673 (2004). | en_US |
dc.identifier.citedreference | K.-H. Hong, B. Hou, J. A. Nees, E. Power, and G. A. Mourou, Appl. Phys. B: Lasers Opt. 81, 447 (2005). | en_US |
dc.identifier.citedreference | M. Kakehata, H. Takada, Y. Kobayashi, K. Torizuka, Y. Fujihira, T. Homman, and H. Takahashi, Opt. Lett. 26, 1436 (2001). | en_US |
dc.identifier.citedreference | M. Kakehata, Y. Fujihira, H. Takada, Y. Kobayashi, K. Torizuka, T. Homman, and H. Takahashi, Appl. Phys. B: Lasers Opt. 74, S43 (2002). | en_US |
dc.identifier.citedreference | I. Thomann, E. Gagnon, R. J. Jones, A. S. Sandhu, A. Lytle, R. Anderson, J. Ye, M. Murnane, and H. Kapteyn, Opt. Express 12, 3493 (2004). | en_US |
dc.identifier.citedreference | D. M. Gaudiosi, A. L. Lytle, P. Kohl, M. M. Murnane, H. C. Kapteyn, and S. Backus, Opt. Lett. 29, 2665 (2004). | en_US |
dc.identifier.citedreference | K.-H. Hong, S. Kostritsa, T. J. Yu, J. H. Sung, I. W. Choi, Y.-C. Noh, D.-K. Ko, and J. Lee, Opt. Express 14, 970 (2006). | en_US |
dc.owningcollname | Physics, Department of |
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