Quantum dot formation on a strain-patterned epitaxial thin film
dc.contributor.author | Wise, S. M. | en_US |
dc.contributor.author | Lowengrub, J. S. | en_US |
dc.contributor.author | Kim, J. S. | en_US |
dc.contributor.author | Thornton, K. | en_US |
dc.contributor.author | Voorhees, P. W. | en_US |
dc.contributor.author | Johnson, W. C. | en_US |
dc.date.accessioned | 2011-11-15T16:09:31Z | |
dc.date.available | 2011-11-15T16:09:31Z | |
dc.date.issued | 2005-09-26 | en_US |
dc.identifier.citation | Wise, S. M.; Lowengrub, J. S.; Kim, J. S.; Thornton, K.; Voorhees, P. W.; Johnson, W. C. (2005). "Quantum dot formation on a strain-patterned epitaxial thin film." Applied Physics Letters 87(13): 133102-133102-3. <http://hdl.handle.net/2027.42/87827> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/87827 | |
dc.description.abstract | We model the effect of substrate strain patterning on the self-assembly of quantum dots (QDs). When the surface energy is isotropic, we demonstrate that strain patterning via embedded substrate inclusions may result in ordered, self-organized QD arrays. However, for systems with strong cubic surface energy anisotropy, the same patterning does not readily lead to an ordered array of pyramids at long times. We conclude that the form of the surface energy anisotropy strongly influences the manner in which QDs self-assemble into regular arrays. | en_US |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Quantum dot formation on a strain-patterned epitaxial thin film | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 | en_US |
dc.contributor.affiliationother | Mathematics Department, University of California, Irvine, California 92697-3875 | en_US |
dc.contributor.affiliationother | Materials Science and Engineering Department, Northwestern University, Evanston, Illinois 60208-3108 | en_US |
dc.contributor.affiliationother | Department of Materials Science and Engineering, University of Virginia, Charlottesvile, Virginia 22904-4745 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/87827/2/133102_1.pdf | |
dc.identifier.doi | 10.1063/1.2061852 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
dc.identifier.citedreference | R. Asaro and W. Tiller, Metall. Trans. 3, 1789 (1972). | en_US |
dc.identifier.citedreference | M. Grinfeld, Dokl. Akad. Nauk SSSR 290, 1358 (1982). | en_US |
dc.identifier.citedreference | D. Eaglesham and M. Cerullo, Phys. Rev. Lett. 64, 1943 (1990). | en_US |
dc.identifier.citedreference | M. DeSeta, G. Capellini, and F. Evangelisti, Phys. Rev. B 71, 115308 (2005). | en_US |
dc.identifier.citedreference | J. Tersoff, C. Teichert, and M. Lagally, Phys. Rev. Lett. 76, 1675 (1996). | en_US |
dc.identifier.citedreference | S. Kiravittaya, H. Heidemeyer, and O. Schmidt, Appl. Phys. Lett. 86, 263113 (2005). | en_US |
dc.identifier.citedreference | S. Wise, J. Lowengrub, J. Kim, and W. Johnson, Superlattices Microstruct. 36, 293 (2004). | en_US |
dc.identifier.citedreference | S. Quek and G. Liu, Thin Solid Films 497, 297 (2005). | en_US |
dc.identifier.citedreference | J. Eggleston, Ph.D. thesis, Northwestern University (2001). | en_US |
dc.identifier.citedreference | J. Eggleston and P. W. Voorhees, Appl. Phys. Lett. 80, 306 (2002). | en_US |
dc.identifier.citedreference | Y. Zhang, Phys. Rev. B 61, 10388 (2000). | en_US |
dc.identifier.citedreference | P. Liu, Y. Zhang, and C. Lu, Appl. Phys. Lett. 80, 3910 (2002). | en_US |
dc.identifier.citedreference | P. Liu, Y. Zhang, and C. Lu, Phys. Rev. B 67, 165414 (2003). | en_US |
dc.identifier.citedreference | P. Liu, Y. Zhang, and C. Lu, Surf. Sci. 526, 375 (2003). | en_US |
dc.identifier.citedreference | A. Golovin, M. Levine, T. Savina, and S. Davis, Phys. Rev. B 70, 235342 (2004). | en_US |
dc.identifier.citedreference | A. Ramasubramaniam and V. Shenoy, J. Appl. Phys. 95, 7813 (2004). | en_US |
dc.identifier.citedreference | A. Rätz, A. Ribalta, and A. Voigt, J. Comput. Phys. (in review). | en_US |
dc.identifier.citedreference | J. Kim, K. Kang, and J. Lowengrub, J. Comp. Physiol. 193, 511 (2003). | en_US |
dc.identifier.citedreference | B. Spencer, P. Voorhees, and J. Tersoff, Phys. Rev. B 64, 235318 (2001). | en_US |
dc.owningcollname | Physics, Department of |
Files in this item
Remediation of Harmful Language
The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.
Accessibility
If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.