Partial encapsulation of Pd particles by reduced ceria-zirconia
dc.contributor.author | Sun, H. P. | en_US |
dc.contributor.author | Pan, X. P. | en_US |
dc.contributor.author | Graham, G. W. | en_US |
dc.contributor.author | Jen, H. -W. | en_US |
dc.contributor.author | McCabe, R. W. | en_US |
dc.contributor.author | Thevuthasan, S. | en_US |
dc.contributor.author | Peden, C. H. F. | en_US |
dc.date.accessioned | 2011-11-15T16:09:42Z | |
dc.date.available | 2011-11-15T16:09:42Z | |
dc.date.issued | 2005-11-14 | en_US |
dc.identifier.citation | Sun, H. P.; Pan, X. P.; Graham, G. W.; Jen, H.-W.; McCabe, R. W.; Thevuthasan, S.; Peden, C. H. F. (2005). "Partial encapsulation of Pd particles by reduced ceria-zirconia." Applied Physics Letters 87(20): 201915-201915-3. <http://hdl.handle.net/2027.42/87836> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/87836 | |
dc.description.abstract | Direct observation of metal-oxide interfaces with atomic resolution can be achieved by cross-sectional high-resolution transmission electron microscopy (HRTEM). Using this approach to study the response of a model, single-crystal thin film automotive exhaust-gas catalyst, Pd particles supported on the (111) ceria-zirconia (CZO) surface, to a redox cycle, we have found two distinct processes for the partial encapsulation of the Pd particles by the reduced CZO surface that depend on their relative crystallographic orientations. In the case of the preferred orientation found for Pd particles on CZO, Pd(111)[110]//CZO(111)[110]Pd(111)[110]∕∕CZO(111)[110], a flat and sharp metal/oxide interface was maintained upon reduction, while ceria-zirconia from the adjacent surface tended to accumulate on and around the Pd particle. In rare cases, Pd particles with other orientations tended to sink into the oxide support upon reduction. Possible mechanisms for these encapsulation processes are proposed. | en_US |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Partial encapsulation of Pd particles by reduced ceria-zirconia | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136 | en_US |
dc.contributor.affiliationum | Chemical Engineering Department, Ford Research Laboratory, Dearborn, Michigan 48121 | en_US |
dc.contributor.affiliationother | Pacific Northwest National Laboratory, P.O. Box 999, Richland, Washington 99352 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/87836/2/201915_1.pdf | |
dc.identifier.doi | 10.1063/1.2132067 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
dc.identifier.citedreference | M. Bäumer and H.-J. Freund, Prog. Surf. Sci. 61, 127 (1999). | en_US |
dc.identifier.citedreference | A. Y. Stakheev and L. M. Kustov, Appl. Catal., A 188, 3 (1999). | en_US |
dc.identifier.citedreference | D. R. Rainer and D. W. Goodman, J. Mol. Catal. A: Chem. 131, 259 (1998). | en_US |
dc.identifier.citedreference | S. J. Tauster, Acc. Chem. Res. 20, 389 (1987). | en_US |
dc.identifier.citedreference | R. A. Bennett, P. Stones, and M. Bowker, Catal. Lett. 59, 99 (1999). | en_US |
dc.identifier.citedreference | J. M. Gatica, R. T. Baker, P. Fornasiero, S. Bernal, and J. Kašpar, J. Phys. Chem. B 105, 1191 (2001). | en_US |
dc.identifier.citedreference | R. T. Baker, S. Bernal, J. J. Calvino, J. M. Gatica, C. López Carts, and J. A. Pérez Omil, Inst. Phys. Conf. Ser. 168, 417 (2001), Section 9. | en_US |
dc.identifier.citedreference | S. Bernal, G. Blanco, J. J. Calvino, C. López-Carts, J. A. Pérez Omil, J. M. Gatica, O. Stephan, and C. Colliex, Catal. Lett. 76, 131 (2001). | en_US |
dc.identifier.citedreference | R. W. McCabe and J. M. Kisenyi, Chem. Ind. 15, 605 (1995). | en_US |
dc.identifier.citedreference | N. V. Skorodumova, S. I. Simak, B. I. Lundqvist, I. A. Abrikosov, and B. Johansson, Phys. Rev. Lett. 89, 166601 (2002). | en_US |
dc.identifier.citedreference | H.-W. Jen, G. W. Graham, W. Chun, R. W. McCabe, J.-P. Cuif, S. E. Deutsch, and O. Touret, Catal. Today 50, 309 (1999). | en_US |
dc.identifier.citedreference | G. W. Graham, H.-W. Jen, R. W. McCabe, A. M. Straccia, and L. P. Haack, Catal. Lett. 67, 99 (2000). | en_US |
dc.identifier.citedreference | G. W. Graham, H.-W. Jen, W. Chun, and R. W. McCabe, J. Catal. 182, 228 (1999). | en_US |
dc.identifier.citedreference | G. W. Graham, H.-W. Jen, W. Chun, and R. W. McCabe, Catal. Lett. 44, 185 (1997). | en_US |
dc.identifier.citedreference | J. C. Jiang, X. Q. Pan, G. W. Graham, R. W. McCabe, and J. Schwank, Catal. Lett. 53, 37 (1998). | en_US |
dc.identifier.citedreference | A. Badri, C. Binet, and J.-C. Lavalley, J. Chem. Soc., Faraday Trans. 92, 1603 (1996). | en_US |
dc.identifier.citedreference | B. R. Powell and S. E. Whittington, J. Catal. 81, 382 (1983). | en_US |
dc.identifier.citedreference | Y. Gao, G. S. Herman, S. Thevuthasan, C. H. F. Peden, and S. A. Chambers, J. Vac. Sci. Technol. A 17, 961 (1999). | en_US |
dc.identifier.citedreference | J. A. Fortner, E. C. Buck, A. J. G. Ellison, and J. K. Bates, Ultramicroscopy 67, 77 (1997). | en_US |
dc.identifier.citedreference | M. Barsoum, Fundamentals of Ceramics (McGraw-Hill, New York, 1997). | en_US |
dc.identifier.citedreference | C. L. Perkins, M. A. Henderson, C. H. F. Peden, and G. S. Herman, J. Vac. Sci. Technol. A 19, 1942 (2001). | en_US |
dc.owningcollname | Physics, Department of |
Files in this item
Remediation of Harmful Language
The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.
Accessibility
If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.