View Item 

Show simple item record

1/f1∕f noise in gold nanoparticle chemosensors
dc.contributor.authorKurdak, C.en_US
dc.contributor.authorKim, J.en_US
dc.contributor.authorKuo, A.en_US
dc.contributor.authorLucido, J. J.en_US
dc.contributor.authorFarina, L. A.en_US
dc.contributor.authorBai, X.en_US
dc.contributor.authorRowe, M. P.en_US
dc.contributor.authorMatzger, A. J.en_US
dc.date.accessioned2011-11-15T16:10:02Z
dc.date.available2011-11-15T16:10:02Z
dc.date.issued2005-02-14en_US
dc.identifier.citationKurdak, C.; Kim, J.; Kuo, A.; Lucido, J. J.; Farina, L. A.; Bai, X.; Rowe, M. P.; Matzger, A. J. (2005). "1/f1∕f noise in gold nanoparticle chemosensors." Applied Physics Letters 86(7): 073506-073506-3. <http://hdl.handle.net/2027.42/87853>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87853
dc.description.abstractWe present a systematic study of low-frequency noise in Au nanoparticle chemosensors. All the sensors we have studied exhibit 1/f1∕f-type noise at low frequencies. The magnitude of the 1/f1∕f noise was smaller in devices with a larger device area, indicating that the 1/f1∕f noise is caused by intrinsic processes. The noise amplitude was found to be strongly temperature dependent between 40–300 K40–300K, with a local peak at around 100 K100K, and weakly dependent below 40 K40K. The noise data could not be fit by a single activated process indicating that multiple noise processes must be present in our sensors.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.title1/f1∕f noise in gold nanoparticle chemosensorsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumPhysics Department, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationumChemistry Department, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87853/2/073506_1.pdf
dc.identifier.doi10.1063/1.1865324en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceM. Brust, D. Bethell, C. J. Kiely, and D. J. Schiffrin, Langmuir 14, 5425 (1998).en_US
dc.identifier.citedreferenceX. M. Lin, H. M. Jaeger, C. M. Sorensen, and K. J. Klabunde, J. Phys. Chem. B 105, 3353 (2001).en_US
dc.identifier.citedreferenceH. Wohltjen and A. W. Snow, Anal. Chem. 70, 2856 (1998).en_US
dc.identifier.citedreferenceS. D. Evans, S. R. Johnson, Y. L. Cheng, and T. Shen, J. Mater. Chem. 10, 183 (2000).en_US
dc.identifier.citedreferenceM. G. Ancona, W. Kruppa, R. W. Rendell, A. W. Snow, D. Park, and J. B. Boos, Phys. Rev. B 64, 033408 (2001).en_US
dc.identifier.citedreferenceL. Han, D. R. Daniel, M. M. Maye, and C. J. Zhong, Anal. Chem. 73, 4441 (2001).en_US
dc.identifier.citedreferenceM. P. Rowe, K. E. Plass, K. Kim, C. Kurdak, E. T. Zellers, and A. J. Matzger, Chem. Mater. 16, 3513 (2004).en_US
dc.identifier.citedreferenceQ. Y. Cai and E. T. Zellers, Anal. Chem. 74, 3533 (2002).en_US
dc.identifier.citedreferenceE.T. Zellers, W.H. Steinecker, G.R. Lambertus, M. Agah, C.-J. Lu, H.K. L. Chan, J.A. Potkay, M.C. Oborny, J.M. Nichols, A. Astle, H.S. Kim, M.P. Rowe, J. Kim, L.W. da Silva, J. Zheng, J.J. Whiting, R.D. Sacks, S.W. Pang, M. Kaviany, P. Bergstrom, A.J. Matzger, C. Kurdak, L.P. Bernal, K. Najafi, and K.D. Wise, Proceedings of the Solid State Sensors, Actuators, and Microsystems Workshop, Transducers Research Foundation Inc., Hilton Head, SC, (2004), pp. 61–66.en_US
dc.identifier.citedreferenceM. Brust, J. Fink, D. Bethell, D. J. Schiffrin, and C. Keily, J. Chem. Soc., Chem. Commun. 1995, 1655 (1995).en_US
dc.identifier.citedreferenceW.H. Steinecker, M.P. Rowe, A.J. Matzger, and E.T. Zellers, Proceedings of the 12th Int. Conf. Solid-State Sens., Actuat. & Microsys.—Transducers ’03, (2003), p. 1139.en_US
dc.identifier.citedreferenceR. Parthasarthy, X. M. Lin, and H. M. Jaeger, Phys. Rev. Lett. 87, 186807 (2001).en_US
dc.identifier.citedreferenceC. Kurdak, J. Kim, L. A. Farina, K. M. Lewis, X. Bai, M. P. Rowe, and A. J. Matzger, Turk. J. Phys. 27, 419 (2003).en_US
dc.identifier.citedreferenceA. A. Middleton and N. S. Wingreen, Phys. Rev. Lett. 71, 3198 (1993).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Name:
073506_1.pdf
Size:
55.01KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.