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Creation of stable molecular junctions with a custom-designed scanning tunneling microscope

dc.contributor.authorLee, Woochulen_US
dc.contributor.authorReddy, Pramoden_US
dc.date.accessioned2012-04-06T20:58:13Z
dc.date.available2012-04-06T20:58:13Z
dc.date.issued2011en_US
dc.identifier.citationLee, Woochul; Reddy, Pramod (2011). "Creation of stable molecular junctions with a custom-designed scanning tunneling microscope." Nanotechnology, vol. 22, 48, 485703. <http://hdl.handle.net/2027.42/90791>en_US
dc.identifier.urihttp://stacks.iop.org/0957-4484/22/i=48/a=485703en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/90791
dc.description.abstractThe scanning tunneling microscope break junction (STMBJ) technique is a powerful approach for creating single-molecule junctions and studying electrical transport in them. However, junctions created using the STMBJ technique are usually mechanically stable for relatively short times (<1 s), impeding detailed studies of their charge transport characteristics. Here, we report a custom-designed scanning tunneling microscope that enables the creation of metal–single molecule–metal junctions that are mechanically stable for more than 1 minute at room temperature. This stability is achieved by a design that minimizes thermal drift as well as the effect of environmental perturbations. The utility of this instrument is demonstrated by performing transition voltage spectroscopy—at the single-molecule level—on Au–hexanedithiol–Au, Au–octanedithiol–Au and Au–decanedithiol–Au junctions.en_US
dc.publisherIOP Publishingen_US
dc.titleCreation of stable molecular junctions with a custom-designed scanning tunneling microscopeen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/90791/1/0957-4484_22_48_485703.pdf
dc.identifier.doi10.1088/0957-4484-22-48-485703en_US
dc.identifier.sourceNanotechnologyen_US
dc.owningcollnamePhysics, Department of


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