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Imaging X-ray crystal spectrometer for laser-produced plasmas

dc.contributor.authorGamboa, E Jen_US
dc.contributor.authorMontgomery, D. S.en_US
dc.contributor.authorHall, I Men_US
dc.contributor.authorDrake, R. Paulen_US
dc.date.accessioned2012-04-06T20:59:16Z
dc.date.available2012-04-06T20:59:16Z
dc.date.issued2011en_US
dc.identifier.citationGamboa, E J; Montgomery, D S; Hall, I M; Drake, R P (2011). "Imaging X-ray crystal spectrometer for laser-produced plasmas." Journal of Instrumentation, vol. 6, 04, P04004. <http://hdl.handle.net/2027.42/90829>en_US
dc.identifier.urihttp://stacks.iop.org/1748-0221/6/i=04/a=P04004en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/90829
dc.description.abstractX-ray Thomson scattering (XRTS) is a powerful technique for measuring state variables in dense plasmas. In this paper, we report on the development of a one-dimensional imaging spectrometer for use in characterizing spatially nonuniform, dense plasmas using XRTS. Diffraction of scattered x-rays from a toroidally curved crystal images along a one-dimensional spatial profile while simultaneously spectrally resolving along the other. An imaging spectrometer was fielded at the Trident laser at Los Alamos National Laboratory, yielding a FWHM spatial resolution of < 25 _m, spectral resolution of 4 eV, spectral range of 350 eV, and spatial range of > 3 mm. A geometrical analysis is performed yielding a simple analytical expression for the throughput of the imaging spectrometer scheme. The SHADOW code is used to perform a ray tracing analysis on the spectrometer fielded at the Trident Laser Facility understand the alignment tolerances on the spatial and spectral resolutions. The analytical expression for the throughput was found to agree well with the results from the ray tracing.en_US
dc.publisherIOP Publishingen_US
dc.titleImaging X-ray crystal spectrometer for laser-produced plasmasen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/90829/1/1748-0221_6_04_P04004.pdf
dc.identifier.doi10.1088/1748-0221-6-04-P04004en_US
dc.identifier.sourceJournal of Instrumentationen_US
dc.owningcollnamePhysics, Department of


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