Show simple item record

P‐103: Novel Poly‐Si TFT Pixel Electrode Circuits and Current Programmed Active‐Matrix Driving Methods for AM‐OLEDs

dc.contributor.authorHong, Yongtaeken_US
dc.contributor.authorKanicki, Jerzyen_US
dc.contributor.authorHattori, Reijien_US
dc.date.accessioned2012-07-12T17:24:02Z
dc.date.available2012-07-12T17:24:02Z
dc.date.issued2002-05en_US
dc.identifier.citationHong, Yongtaek; Kanicki, Jerzy; Hattori, Reiji (2002). "P‐103: Novel Poly‐Si TFT Pixel Electrode Circuits and Current Programmed Active‐Matrix Driving Methods for AM‐OLEDs." SID Symposium Digest of Technical Papers 33(1). <http://hdl.handle.net/2027.42/92064>en_US
dc.identifier.issn0097-966Xen_US
dc.identifier.issn2168-0159en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/92064
dc.description.abstractIn this paper, we present the systematic analysis of the current‐programmed poly‐Si pixel electrode circuits with current‐sink‐type charging functionality and duty ratio controllability. Two different driving schemes for top‐cathode and top‐anode organic light‐emitting device structures are described and compared. Their limitations and advantages are also discussed.en_US
dc.publisherBlackwell Publishing Ltden_US
dc.publisherWiley Periodicals, Inc.en_US
dc.titleP‐103: Novel Poly‐Si TFT Pixel Electrode Circuits and Current Programmed Active‐Matrix Driving Methods for AM‐OLEDsen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumSolid‐State Electronics Lab., Dept. of EECS, The University of Michigan, Ann Arbor, MI, USAen_US
dc.contributor.affiliationotherDept. of electronic Device Eng., Kyushu University, Higashi‐ku, Fukuoka, Japanen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/92064/1/1.1830417.pdf
dc.identifier.doi10.1889/1.1830417en_US
dc.identifier.sourceSID Symposium Digest of Technical Papersen_US
dc.identifier.citedreferenceT. Sasaoka, M. Sekiya, A. Yumoto, J. Yamada, T. Hirano, Y. Iwase, T. Yamada, T. Ishibashi, T. Mori, M. Asano, S. Tamura, and T. Urabe, SID Symposium Digest 32, 384 ( 2001 ).en_US
dc.identifier.citedreferenceHaskal, E.I., Buechel, M., Sempel, A., Heeks, S.K., Athanassopoulou, N., Carter, J.C., Wu, W., O'Brien, J.M. Fleuster, and Visser, R.J., Proceedings of Asia Display '01, 1411 ( 2001 ).en_US
dc.identifier.citedreferenceDawson, R.M. A., Shen, A., Furst, D.A., Connor, S., Hsu, J., Kane, M.G., Stewart, R.G., Ipri, A., King, C.N., Green, P.J., Flegal, R.T., Pearson, S., Barrow, W.A., Dickey, E., Ping, K., Robinson, S., Tang, C.W., Van Slyke, S., Chen, F., Shi, J., Lu, M.H., and Sturm, J.C., IEDM '98, 875 ( 1998 ).en_US
dc.identifier.citedreferenceMiyashita, S., Imamura, Y., Takeshita, H., Atobe, M., Yokoyama, O., Matsueda, Y., Miyazawa, T., Nishimaki, M., Proceedings of Asia Display '01, 1399 ( 2001 ).en_US
dc.identifier.citedreferenceM. D. Jacunski, M. S. Shur, A. A. Owusu, T. Ytterdal, M. Hack, and B. Iniguez, IEEE Trans. Elect. Dev. 46, 1146 ( 1999 ).en_US
dc.identifier.citedreferenceHong, Y. and Kanicki, J., Proceedings of Asia Display '01, 1443 ( 2001 ).en_US
dc.identifier.citedreferenceY. He, R. Hattori, and J. Kanicki, IEEE Trans. Elec. Dev. 48, 1322 ( 2001 ).en_US
dc.identifier.citedreferenceY. He, R. Hattori, and J. Kanicki, IEEE Elec. Dev. Lett. 21, 590 ( 2000 ).en_US
dc.identifier.citedreferenceHattori, R., Kuroki, Y., and Kanicki, J., AM‐LCD '1, 223 ( 2001 ).en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.