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Thermal transport in thin films measured by time-resolved, grazing incidence x-ray diffraction
dc.contributor.authorWalko, D. A.en_US
dc.contributor.authorSheu, Y.-M.en_US
dc.contributor.authorTrigo, M.en_US
dc.contributor.authorReis, D. A.en_US
dc.date.accessioned2013-07-03T19:31:38Z
dc.date.available2013-07-03T19:31:38Z
dc.date.issued2011-11-15en_US
dc.identifier.citationWalko, D. A.; Sheu, Y.-M.; Trigo, M.; Reis, D. A. (2011). "Thermal transport in thin films measured by time-resolved, grazing incidence x-ray diffraction." Journal of Applied Physics, 110(10): 102203. <http://hdl.handle.net/2027.42/98715>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/98715
dc.publisherThe American Institute of Physicsen_US
dc.subjectBismuthen_US
dc.subjectElectric Admittanceen_US
dc.subjectHigh-speed Optical Techniquesen_US
dc.subjectKapitza Resistanceen_US
dc.subjectMetallic Thin Filmsen_US
dc.subjectSurface Conductivityen_US
dc.subjectThermal Conductivityen_US
dc.subjectTime Resolved Spectraen_US
dc.subjectX-ray Diffractionen_US
dc.titleThermal transport in thin films measured by time-resolved, grazing incidence x-ray diffractionen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/98715/1/JApplPhys_110_102203.pdf
dc.identifier.doi10.1063/1.3661164en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.owningcollnamePhysics, Department of


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