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Thermal analysis of high intensity organic light-emitting diodes based on a transmission matrix approach
dc.contributor.authorQi, Xiangfeien_US
dc.contributor.authorForrest, Stephen R.en_US
dc.date.accessioned2013-07-03T19:31:39Z
dc.date.available2013-07-03T19:31:39Z
dc.date.issued2011-12-15en_US
dc.identifier.citationQi, Xiangfei; Forrest, Stephen R. (2011). "Thermal analysis of high intensity organic light-emitting diodes based on a transmission matrix approach." Journal of Applied Physics, 110(12): 124516. <http://hdl.handle.net/2027.42/98717>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/98717
dc.publisherThe American Institute of Physicsen_US
dc.subjectComposite Materialsen_US
dc.subjectConvectionen_US
dc.subjectHeat Conductionen_US
dc.subjectHeat Radiationen_US
dc.subjectLaplace Transformsen_US
dc.subjectMultilayersen_US
dc.subjectOrganic Light Emitting Diodesen_US
dc.subjectPhosphorescenceen_US
dc.subjectThermal Analysisen_US
dc.subjectThermal Conductivityen_US
dc.titleThermal analysis of high intensity organic light-emitting diodes based on a transmission matrix approachen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/98717/1/JApplPhys_110_124516.pdf
dc.identifier.doi10.1063/1.3671067en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.owningcollnamePhysics, Department of


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