Show simple item record

Laser-ion acceleration through controlled surface contamination

dc.contributor.authorHou, Bixueen_US
dc.contributor.authorNees, John A.en_US
dc.contributor.authorHe, Zhaohanen_US
dc.contributor.authorPetrov, Georgeen_US
dc.contributor.authorDavis, Jacken_US
dc.contributor.authorEaster, James H.en_US
dc.contributor.authorThomas, Alexander G. R.en_US
dc.contributor.authorKrushelnick, Karl M.en_US
dc.date.accessioned2013-07-03T19:31:49Z
dc.date.available2013-07-03T19:31:49Z
dc.date.issued2011-04en_US
dc.identifier.citationHou, Bixue; Nees, John A.; He, Zhaohan; Petrov, George; Davis, Jack; Easter, James H.; Thomas, Alexander G. R.; Krushelnick, Karl M. (2011). "Laser-ion acceleration through controlled surface contamination." Physics of Plasmas, 18(4): 40702. <http://hdl.handle.net/2027.42/98750>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/98750
dc.publisherThe American Institute of Physicsen_US
dc.subjectDeuteronsen_US
dc.subjectIon Acceleratorsen_US
dc.subjectPlasma Acceleratorsen_US
dc.subjectPlasma Impuritiesen_US
dc.subjectPlasma Light Propagationen_US
dc.subjectPlasma Production by Laseren_US
dc.titleLaser-ion acceleration through controlled surface contaminationen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/98750/1/PhysPlasmas_18_040702.pdf
dc.identifier.doi10.1063/1.3574532en_US
dc.identifier.sourcePhysics of Plasmasen_US
dc.owningcollnamePhysics, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.