Show simple item record

Small angle X-ray scattering (SAXS) studies of sol to gel transition in K 2 O-Al 2 O 3 -SiO 2 system

dc.contributor.authorLee, K. J.en_US
dc.contributor.authorHristov, Hristo A.en_US
dc.contributor.authorTien, Tseng-Yingen_US
dc.contributor.authorGulari, Erdoganen_US
dc.date.accessioned2006-09-11T15:12:43Z
dc.date.available2006-09-11T15:12:43Z
dc.date.issued1996-01en_US
dc.identifier.citationLee, K. J.; Hristov, H. A.; Tien, T. Y.; Gulari, E.; (1996). "Small angle X-ray scattering (SAXS) studies of sol to gel transition in K 2 O-Al 2 O 3 -SiO 2 system." Journal of Materials Science 31(5): 1341-1344. <http://hdl.handle.net/2027.42/44738>en_US
dc.identifier.issn1573-4803en_US
dc.identifier.issn0022-2461en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/44738
dc.description.abstractThe structural evolution during a sol to gel transition reaction in the K 2 O-Al 2 O 3 -SiO 2 system was investigated by using in situ small angle X-ray scattering (SAXS) technique. The results are interpreted as evidence of the presence of at least two different gel phases. The analysis shows that the primary phase is composed of small particles with characteristic size of ∼3.0 nm, and considerable size and shape variation. The primary phase is identified as a random phase in the Debye sense. The primary particles aggregate into larger formations with spherical symmetry. The size of larger aggregates (second phase) increases continuously in the course of gelation and levels off after reaching ∼15.0 nm. The volume fraction of the second phase keeps increasing until the end of the measurement which is far after the gelation (3-fold of the gelation time).en_US
dc.format.extent460905 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherKluwer Academic Publishers; Chapman & Hall ; Springer Science+Business Mediaen_US
dc.subject.otherMechanicsen_US
dc.subject.otherEngineeringen_US
dc.subject.otherPolymer Sciencesen_US
dc.subject.otherIndustrial Chemistry/Chemical Engineeringen_US
dc.subject.otherMaterials Processing, Characterization, and Designen_US
dc.titleSmall angle X-ray scattering (SAXS) studies of sol to gel transition in K 2 O-Al 2 O 3 -SiO 2 systemen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbsecondlevelEngineering (General)en_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 480109-2136, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Chemical Engineering, University of Michigan, 480109-2136, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 480109-2136, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 480109-2136, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/44738/1/10853_2004_Article_BF00353115.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF00353115en_US
dc.identifier.sourceJournal of Materials Scienceen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.