A novel method to enhance the sensitivity for two-degrees-of-freedom straightness measurement
dc.contributor.author | Kuang, Cuifang | en_US |
dc.contributor.author | Hong, En | en_US |
dc.contributor.author | Feng, Qibo | en_US |
dc.contributor.author | Zhang, Bin | en_US |
dc.contributor.author | Zhang, Zhifeng | en_US |
dc.date.accessioned | 2008-04-02T14:40:57Z | |
dc.date.available | 2008-04-02T14:40:57Z | |
dc.date.issued | 2007-12-01 | en_US |
dc.identifier.citation | Kuang, Cuifang; Hong, En; Feng, Qibo; Zhang, Bin; Zhang, Zhifeng (2007). "A novel method to enhance the sensitivity for two-degrees-of-freedom straightness measurement." Measurement Science and Technology. 18(12): 3795-3800. <http://hdl.handle.net/2027.42/58131> | en_US |
dc.identifier.issn | 0957-0233 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/58131 | |
dc.description.abstract | A low cost and high precision system which can measure two-degrees-of-freedom straightness simultaneously is proposed based on a laser collimator. In the system, a miniature fiber coupled diode laser generates a collimating beam. The sensitivity of the straightness error measurement is magnified by a factor of 4 compared with the lateral movement of the retro-reflector itself after the multi-reflections. A Renishaw ML10 laser interference measurement system was used to verify the developed system in a series of experiments in the laboratory environment. Experimental results agree with the expected results. The two-dimensional straightness error measurement had linear correlativity close to 1 and the standard one-to-one deviation error was better than 0.32 µm obtained over a travel range of 600 µm. | en_US |
dc.format.extent | 3118 bytes | |
dc.format.extent | 245858 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | IOP Publishing Ltd | en_US |
dc.title | A novel method to enhance the sensitivity for two-degrees-of-freedom straightness measurement | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Mechanical Engineering Department, University of Michigan, Ann Arbor, MI 48109-2125, USA | en_US |
dc.contributor.affiliationother | School of Science, Beijing Jiaotong University, Beijing 100044, People's Republic of China; School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, People's Republic of China | en_US |
dc.contributor.affiliationother | School of Science, Beijing Jiaotong University, Beijing 100044, People's Republic of China | en_US |
dc.contributor.affiliationother | School of Science, Beijing Jiaotong University, Beijing 100044, People's Republic of China | en_US |
dc.contributor.affiliationother | School of Science, Beijing Jiaotong University, Beijing 100044, People's Republic of China | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/58131/2/mst7_12_014.pdf | |
dc.identifier.doi | http://dx.doi.org/10.1088/0957-0233/18/12/014 | en_US |
dc.identifier.source | Measurement Science and Technology. | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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