Orientation‐dependent phase modulation in InGaAs/GaAs multiquantum well waveguides

Das, Utpal; Chen, Yi; Bhattacharya, Pallab K.; Berger, Paul R.

Orientation‐dependent phase modulation in InGaAs/GaAs multiquantum well waveguides

dc.contributor.author	Das, Utpal	en_US
dc.contributor.author	Chen, Yi	en_US
dc.contributor.author	Bhattacharya, Pallab K.	en_US
dc.contributor.author	Berger, Paul R.	en_US
dc.date.accessioned	2010-05-06T21:43:35Z
dc.date.available	2010-05-06T21:43:35Z
dc.date.issued	1988-11-28	en_US
dc.identifier.citation	Das, Utpal; Chen, Yi; Bhattacharya, Pallab K.; Berger, Paul R. (1988). "Orientation‐dependent phase modulation in InGaAs/GaAs multiquantum well waveguides." Applied Physics Letters 53(22): 2129-2131. <http://hdl.handle.net/2027.42/70160>	en_US
dc.identifier.uri	https://hdl.handle.net/2027.42/70160
dc.description.abstract	The electro‐optic effect and phase modulation in In0.2 Ga0.8 As/GaAs multiple quantum wells have been experimentally studied for the first time. The experiments were done with 1.06 and 1.15 μm photoexcitation which are, respectively, 25 and 115 meV below the electron–heavy hole excitonic resonance. Strong quadratic electro‐optic effect was observed near the excitonic edge in addition to the linear effect. These are characterized by r63 =−1.85×10−19 m/V and (R33 −R13 )=2.9×10−19 m2 /V2 . In addition, we observe a dispersion in the value of r63 . The relative phase shifts are higher in the strained system at 1.06 μm than in lattice‐matched GaAs/AlGaAs.	en_US
dc.format.extent	3102 bytes
dc.format.extent	320288 bytes
dc.format.mimetype	text/plain
dc.format.mimetype	application/pdf
dc.publisher	The American Institute of Physics	en_US
dc.rights	© The American Institute of Physics	en_US
dc.title	Orientation‐dependent phase modulation in InGaAs/GaAs multiquantum well waveguides	en_US
dc.type	Article	en_US
dc.subject.hlbsecondlevel	Physics	en_US
dc.subject.hlbtoplevel	Science	en_US
dc.description.peerreviewed	Peer Reviewed	en_US
dc.contributor.affiliationum	Solid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109‐2122	en_US
dc.description.bitstreamurl	http://deepblue.lib.umich.edu/bitstream/2027.42/70160/2/APPLAB-53-22-2129-1.pdf
dc.identifier.doi	10.1063/1.100295	en_US
dc.identifier.source	Applied Physics Letters	en_US
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dc.owningcollname	Physics, Department of

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