Now showing items 1-12 of 12
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Karpenko, O. P.; Bilello, John C.; Yalisove, Steven M. (The American Institute of Physics, 1994-10-15)
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Adams, David P.; Vill, M. A.; Tao, J.; Bilello, John C.; Yalisove, Steven M. (The American Institute of Physics, 1993-07-15)
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Malhotra, S. G.; Rek, Z. U.; Yalisove, Steven M.; Bilello, John C. (The American Institute of Physics, 1996-05-01)
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Zhao, Z. B.; Yalisove, Steven M.; Rek, Z. U.; Bilello, John C. (The American Institute of Physics, 2002-12-15)
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Zhao, Z. B.; Rek, Z. U.; Yalisove, Steven M.; Bilello, John C. (The American Institute of Physics, 2005-01-15)
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Bilello, John C.; Yalisove, Steven M.; Rek, Z. U. (IOP Publishing Ltd, 1995-04-14)
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Karpenko, O. P.; Bilello, John C.; Yalisove, Steven M. (The American Institute of Physics, 1997-08-01)
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Growth textures of thick sputtered films and multilayers assessed via synchrotron transmission Laue Vill, M. A.; Rek, Z. U.; Yalisove, Steven M.; Bilello, John C. (The American Institute of Physics, 1995-09-15)
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French, B. L.; Daniels, M. J.; Bilello, John C. (IOP Publishing Ltd, 2005-05-21)
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French, B. L.; Bilello, John C. (The American Institute of Physics, 2003-07-01)
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Tokarz, Michelle L.; Bilello, John C. (The American Institute of Physics, 2006-10-01)
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Whitacre, J. F.; Rek, Z. U.; Bilello, John C.; Yalisove, Steven M. (The American Institute of Physics, 1998-08-01)