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The bound-state resonant tunneling transistor (BSRTT): Fabrication, D.C. I-V characteristics and high-frequency properties

dc.contributor.authorHaddad, George I.en_US
dc.contributor.authorReddy, U. K.en_US
dc.contributor.authorSun, J. P.en_US
dc.contributor.authorMains, R. K.en_US
dc.date.accessioned2006-04-10T13:56:13Z
dc.date.available2006-04-10T13:56:13Z
dc.date.issued1990en_US
dc.identifier.citationHaddad, G. I., Reddy, U. K., Sun, J. P., Mains, R. K. (1990)."The bound-state resonant tunneling transistor (BSRTT): Fabrication, D.C. I-V characteristics and high-frequency properties." Superlattices and Microstructures 7(4): 369-374. <http://hdl.handle.net/2027.42/28877>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6WXB-4951G4F-9J/2/4aa846ec14b37f85668c1cde150dde04en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/28877
dc.description.abstractThe output characteristics of resonant tunneling transistors with a charge filled bound state quantum well base obtained by a self-consistent solution of Poisson's and Schrodinger's equations show the effect of coupling between the input and output ports of the device and the effect on the current-voltage characteristics. Using a self-aligned process transistors were fabricated which showed a current gain of 3 and transconductances of 30 mS. The output characteristics do not saturate and this is in qualitative agreement with theoretical predictions. The charge and potential distributions obtained from the self-consistent calculations are used in a quasi-static analysis of the small signal parameters for a hybrid-[pi] model, and the high-frequency performance of the transistor is analyzed.en_US
dc.format.extent525360 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleThe bound-state resonant tunneling transistor (BSRTT): Fabrication, D.C. I-V characteristics and high-frequency propertiesen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USAen_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USAen_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USAen_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/28877/1/0000712.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0749-6036(90)90228-Yen_US
dc.identifier.sourceSuperlattices and Microstructuresen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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