The bound-state resonant tunneling transistor (BSRTT): Fabrication, D.C. I-V characteristics and high-frequency properties
dc.contributor.author | Haddad, George I. | en_US |
dc.contributor.author | Reddy, U. K. | en_US |
dc.contributor.author | Sun, J. P. | en_US |
dc.contributor.author | Mains, R. K. | en_US |
dc.date.accessioned | 2006-04-10T13:56:13Z | |
dc.date.available | 2006-04-10T13:56:13Z | |
dc.date.issued | 1990 | en_US |
dc.identifier.citation | Haddad, G. I., Reddy, U. K., Sun, J. P., Mains, R. K. (1990)."The bound-state resonant tunneling transistor (BSRTT): Fabrication, D.C. I-V characteristics and high-frequency properties." Superlattices and Microstructures 7(4): 369-374. <http://hdl.handle.net/2027.42/28877> | en_US |
dc.identifier.uri | http://www.sciencedirect.com/science/article/B6WXB-4951G4F-9J/2/4aa846ec14b37f85668c1cde150dde04 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/28877 | |
dc.description.abstract | The output characteristics of resonant tunneling transistors with a charge filled bound state quantum well base obtained by a self-consistent solution of Poisson's and Schrodinger's equations show the effect of coupling between the input and output ports of the device and the effect on the current-voltage characteristics. Using a self-aligned process transistors were fabricated which showed a current gain of 3 and transconductances of 30 mS. The output characteristics do not saturate and this is in qualitative agreement with theoretical predictions. The charge and potential distributions obtained from the self-consistent calculations are used in a quasi-static analysis of the small signal parameters for a hybrid-[pi] model, and the high-frequency performance of the transistor is analyzed. | en_US |
dc.format.extent | 525360 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Elsevier | en_US |
dc.title | The bound-state resonant tunneling transistor (BSRTT): Fabrication, D.C. I-V characteristics and high-frequency properties | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbsecondlevel | Mathematics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Center for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USA | en_US |
dc.contributor.affiliationum | Center for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USA | en_US |
dc.contributor.affiliationum | Center for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USA | en_US |
dc.contributor.affiliationum | Center for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science The University of Michigan, Ann Arbor, Michigan 48109-2122, USA | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/28877/1/0000712.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1016/0749-6036(90)90228-Y | en_US |
dc.identifier.source | Superlattices and Microstructures | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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