Defect and strain in hydrogen and helium coimplanted single-crystal silicon
dc.contributor.author | Duo, Xinzhong | en_US |
dc.contributor.author | Liu, Weili | en_US |
dc.contributor.author | Xing, Su | en_US |
dc.contributor.author | Zhang, Miao | en_US |
dc.contributor.author | Fu, Xiaorong | en_US |
dc.contributor.author | Lin, Chenglu | en_US |
dc.contributor.author | Hu, Peigang | en_US |
dc.contributor.author | Wang, S. X. | en_US |
dc.contributor.author | Wang, L. M. | en_US |
dc.date.accessioned | 2006-12-19T18:58:24Z | |
dc.date.available | 2006-12-19T18:58:24Z | |
dc.date.issued | 2001-01-07 | en_US |
dc.identifier.citation | Duo, Xinzhong; Liu, Weili; Xing, Su; Zhang, Miao; Fu, Xiaorong; Lin, Chenglu; Hu, Pegang; Wang, S X; Wang, L M (2001). "Defect and strain in hydrogen and helium coimplanted single-crystal silicon." Journal of Physics D: Applied Physics. 34(1): 5-11. <http://hdl.handle.net/2027.42/48907> | en_US |
dc.identifier.issn | 0022-3727 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/48907 | |
dc.description.abstract | In this paper we studied the processes of blistering and exfoliation on the surface of crystal silicon, the evolution of defects/strains in the crystal silicon caused by hydrogen and helium coimplantation during annealing, and the formation of platelets and bubbles in the crystal. It is shown that H + and He + coimplantation produces a synergistic effect, which greatly decreases the total implantation dose, compared with either just H + or He + implantation. We also present the effect of coimplantation and analyse the different roles of H and He in the process of exfoliation during annealing. It seems that the essential role of hydrogen is to interact chemically with the defects in the silicon and create H-stabilized platelets, while the role of helium is to effuse into these platelets and exert a pressure on the inner surface of these platelets. The damage caused by coimplantation is lower than by hydrogen implantation (at the dose that exfoliation requires). | en_US |
dc.format.extent | 3118 bytes | |
dc.format.extent | 368631 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.publisher | IOP Publishing Ltd | en_US |
dc.title | Defect and strain in hydrogen and helium coimplanted single-crystal silicon | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Nuclear Engineering and Radiological Sciences, College of Engineering, The University of Michigan, MI, USA | en_US |
dc.contributor.affiliationum | Department of Nuclear Engineering and Radiological Sciences, College of Engineering, The University of Michigan, MI, USA | en_US |
dc.contributor.affiliationother | State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People's Republic of China | en_US |
dc.contributor.affiliationother | State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People's Republic of China | en_US |
dc.contributor.affiliationother | State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People's Republic of China | en_US |
dc.contributor.affiliationother | State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People's Republic of China | en_US |
dc.contributor.affiliationother | State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People's Republic of China | en_US |
dc.contributor.affiliationother | State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People's Republic of China | en_US |
dc.contributor.affiliationother | Applied Ion Beam Physics Laboratory, Fudan University, Shanghai 200433, People's Republic of China | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/48907/2/d10102.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1088/0022-3727/34/1/302 | en_US |
dc.identifier.source | Journal of Physics D: Applied Physics. | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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