Structural characterization of epitaxial YBCO thin films prepared by a fluorine-free sol–gel method for coated conductors
Lian, Jie; Yao, Haibo; Shi, Donglu; Wang, Lumin; Xu, Yongli; Liu, Qing; Han, Zhenguo
2003-08-01
Citation
Lian, Jie; Yao, Haibo; Shi, Donglu; Wang, Lumin; Xu, Yongli; Liu, Qing; Han, Z (2003). "Structural characterization of epitaxial YBCO thin films prepared by a fluorine-free sol–gel method for coated conductors." Superconductor Science and Technology. 16(8): 838-844. <http://hdl.handle.net/2027.42/48991>
Abstract
Using a fluorine-free sol–gel method, both c- and a-axis textured YBCO thin films were synthesized in low oxygen partial pressure. The experimental results of both x-ray diffraction 2θ scan and pole figure showed well epitaxial grown films on LaAlO3 (LAO) single crystal substrates. When the processing condition was altered, the scanning electron microscopy indicated a large fraction of a-axis oriented grains in the film. High-resolution transmission electron microscopy was performed on both types of films and revealed interface lattice structural characteristics. A classic nucleation and growth model was used to explain the texturing mechanism. Other possible mechanisms for the a-axis oriented grains are also discussed.Publisher
IOP Publishing Ltd
ISSN
0953-2048
Other DOIs
Types
Article
Metadata
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