Practical phase identification by convergent beam electron diffraction
dc.contributor.author | Mansfield, John F. | en_US |
dc.date.accessioned | 2007-04-06T18:58:39Z | |
dc.date.available | 2007-04-06T18:58:39Z | |
dc.date.issued | 1989-09 | en_US |
dc.identifier.citation | Mansfield, John (1989)."Practical phase identification by convergent beam electron diffraction." Journal of Electron Microscopy Technique 13(1): 3-15. <http://hdl.handle.net/2027.42/50388> | en_US |
dc.identifier.issn | 0741-0581 | en_US |
dc.identifier.issn | 1553-0817 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/50388 | |
dc.identifier.uri | http://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=2778525&dopt=citation | en_US |
dc.description.abstract | The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by symmetry analysis or by simple comparison of a pattern observed in the microscope with a previously recorded pattern (fingerprinting). There is a strong emphasis on practical hints and useful shortcuts. | en_US |
dc.format.extent | 1617472 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.publisher | Wiley Subscription Services, Inc., A Wiley Company | en_US |
dc.subject.other | Life and Medical Sciences | en_US |
dc.subject.other | Cell & Developmental Biology | en_US |
dc.title | Practical phase identification by convergent beam electron diffraction | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Science (General) | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | North Campus Electron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor, Michigan 48109-2143 ; North Campus Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward, Ann Arbor, MI 48109-2143 | en_US |
dc.identifier.pmid | 2778525 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/50388/1/1060130104_ftp.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1002/jemt.1060130104 | en_US |
dc.identifier.source | Journal of Electron Microscopy Technique | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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