Practical phase identification by convergent beam electron diffraction

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dc.contributor.author Mansfield, John F. en_US
dc.date.accessioned 2007-04-06T18:58:39Z
dc.date.available 2007-04-06T18:58:39Z
dc.date.issued 1989-09 en_US
dc.identifier.citation Mansfield, John (1989)."Practical phase identification by convergent beam electron diffraction." Journal of Electron Microscopy Technique 13(1): 3-15. <http://hdl.handle.net/2027.42/50388> en_US
dc.identifier.issn 0741-0581 en_US
dc.identifier.issn 1553-0817 en_US
dc.identifier.uri http://hdl.handle.net/2027.42/50388
dc.identifier.uri http://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=2778525&dopt=citation en_US
dc.description.abstract The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by symmetry analysis or by simple comparison of a pattern observed in the microscope with a previously recorded pattern (fingerprinting). There is a strong emphasis on practical hints and useful shortcuts. en_US
dc.format.extent 1617472 bytes
dc.format.extent 3118 bytes
dc.format.mimetype application/pdf
dc.format.mimetype text/plain
dc.publisher Wiley Subscription Services, Inc., A Wiley Company en_US
dc.subject.other Life and Medical Sciences en_US
dc.subject.other Cell & Developmental Biology en_US
dc.title Practical phase identification by convergent beam electron diffraction en_US
dc.type Article en_US
dc.rights.robots IndexNoFollow en_US
dc.subject.hlbsecondlevel Science (General) en_US
dc.subject.hlbtoplevel Science en_US
dc.description.peerreviewed Peer Reviewed en_US
dc.contributor.affiliationum North Campus Electron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor, Michigan 48109-2143 ; North Campus Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward, Ann Arbor, MI 48109-2143 en_US
dc.identifier.pmid 2778525 en_US
dc.description.bitstreamurl http://deepblue.lib.umich.edu/bitstream/2027.42/50388/1/1060130104_ftp.pdf en_US
dc.identifier.doi http://dx.doi.org/10.1002/jemt.1060130104 en_US
dc.identifier.source Journal of Electron Microscopy Technique en_US
dc.owningcollname Interdisciplinary and Peer-Reviewed
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