Grain boundary character distributions in Ni-16Cr-9Fe using selected area channeling patterns: Methodology and results
dc.contributor.author | Crawford, Douglas C. | en_US |
dc.contributor.author | Was, Gary S. | en_US |
dc.date.accessioned | 2007-04-06T18:58:52Z | |
dc.date.available | 2007-04-06T18:58:52Z | |
dc.date.issued | 1991-11 | en_US |
dc.identifier.citation | Crawford, Douglas C.; Was, Gary S. (1991)."Grain boundary character distributions in Ni-16Cr-9Fe using selected area channeling patterns: Methodology and results." Journal of Electron Microscopy Technique 19(3): 345-360. <http://hdl.handle.net/2027.42/50390> | en_US |
dc.identifier.issn | 0741-0581 | en_US |
dc.identifier.issn | 1553-0817 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/50390 | |
dc.identifier.uri | http://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=1795187&dopt=citation | en_US |
dc.description.abstract | Selected area channeling patterns imaged on an SEM are digitized and displayed on the screen of a Macintosh computer, on which the user selects channeling bands that are measured to determine orientation. Grain boundary misorientations are found using the orientation information for pairs of grains adjacent at grain boundaries, and the boundaries are classified as low angle boundaries (LABs), coincident site lattice boundaries (CSLBs), or general boundaries (GHABs) based on the misorientation information. The technique was implemented to analyze the grain boundary character distributions (GBCDs) in Ni-16Cr-9Fe. The GBCDs of solution annealed material were similar to those expected in an aggregate of randomly oriented polycrystals. However, sequential thermomechanical treatments (5% tensile strain + 945°C:75 min + 2% tensile strain + 890°C:15 h + 3% tensile strain + 890°C:20 h or 9% compressive strain + 890°C:20 h + 9% compressive strain + 890°C:20 h + 3% compressive strain + 890°C:15 h) applied after the solution anneal lowered the proportions of GHABs in the GBCDs from 76–79% to 47–64%. The CSL-enhanced GBCDs of both the tensile-deformed samples and the compression-deformed sample appear to have evolved mainly through impingement of twin and twin-related boundaries during recrystallization; the CSL-enhanced GBCD of a compression-deformed sample appears to have been influenced by grain rotation processes to a greater degree than were the tensile-deformed samples. The CSL boundaries in the CSL-enhanced GBCDs were, in general, closer to the exact CSL misorientations than were those in the near-random GBCDs of the solution annealed material. An analysis of the distribution of misorientation axes did not indicate any correlation between grain misorientation texture and GBCD evolution. | en_US |
dc.format.extent | 1566018 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.publisher | Wiley Subscription Services, Inc., A Wiley Company | en_US |
dc.subject.other | Life and Medical Sciences | en_US |
dc.subject.other | Cell & Developmental Biology | en_US |
dc.title | Grain boundary character distributions in Ni-16Cr-9Fe using selected area channeling patterns: Methodology and results | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Science (General) | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Nuclear Engineering, University of Michigan, Ann Arbor, Michigan 48109 ; Fuels and Processes Division, Argonne National Laboratory-West, P.O. Box 2528, Idaho Falls, ID 83403–2528 | en_US |
dc.contributor.affiliationum | Department of Nuclear Engineering, University of Michigan, Ann Arbor, Michigan 48109 ; Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.identifier.pmid | 1795187 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/50390/1/1060190309_ftp.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1002/jemt.1060190309 | en_US |
dc.identifier.source | Journal of Electron Microscopy Technique | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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