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Highly Efficient, Near-Infrared Electrophosphorescence from a Pt–Metalloporphyrin Complex The authors acknowledge financial support from the U.S. Dept. of the Army, CECOM for the phase 14II SBIR program (contract no. 14W15P7T-06-C-T201), and Universal Display Corporation.

dc.contributor.authorBorek, Carstenen_US
dc.contributor.authorHanson, Kennethen_US
dc.contributor.authorDjurovich, Peter I.en_US
dc.contributor.authorThompson, Mark E.en_US
dc.contributor.authorAznavour, Kristenen_US
dc.contributor.authorBau, Roberten_US
dc.contributor.authorSun, Yiruen_US
dc.contributor.authorForrest, Stephen R.en_US
dc.contributor.authorBrooks, Jasonen_US
dc.contributor.authorMichalski, Lechen_US
dc.contributor.authorBrown, Julieen_US
dc.date.accessioned2007-09-20T18:10:21Z
dc.date.available2008-04-03T18:49:13Zen_US
dc.date.issued2007-02-05en_US
dc.identifier.citationBorek, Carsten; Hanson, Kenneth; Djurovich, Peter 14I.; Thompson, Mark 14E.; Aznavour, Kristen; Bau, Robert; Sun, Yiru; Forrest, Stephen 14R.; Brooks, Jason; Michalski, Lech; Brown, Julie (2007). "Highly Efficient, Near-Infrared Electrophosphorescence from a Pt–Metalloporphyrin Complex The authors acknowledge financial support from the U.S. Dept. of the Army, CECOM for the phase 14II SBIR program (contract no. 14W15P7T-06-C-T201), and Universal Display Corporation. ." Angewandte Chemie 119(7): 1127-1130. <http://hdl.handle.net/2027.42/55937>en_US
dc.identifier.issn0044-8249en_US
dc.identifier.issn1521-3757en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/55937
dc.description.abstractNo Abstracten_US
dc.format.extent252577 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWILEY-VCH Verlagen_US
dc.subject.otherChemistryen_US
dc.subject.otherGeneral Chemistryen_US
dc.titleHighly Efficient, Near-Infrared Electrophosphorescence from a Pt–Metalloporphyrin Complex The authors acknowledge financial support from the U.S. Dept. of the Army, CECOM for the phase 14II SBIR program (contract no. 14W15P7T-06-C-T201), and Universal Display Corporation.en_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelChemical Engineeringen_US
dc.subject.hlbsecondlevelChemistryen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemistry, University of Southern California, Los Angeles, CA 99089, USA, Fax: (+1) 213-740-8594 ;en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science and Department of Physics, University of Michigan, Ann Arbor, MI 48109, USAen_US
dc.contributor.affiliationotherDepartment of Chemistry, University of Southern California, Los Angeles, CA 99089, USA, Fax: (+1) 213-740-8594en_US
dc.contributor.affiliationotherDepartment of Chemistry, University of Southern California, Los Angeles, CA 99089, USA, Fax: (+1) 213-740-8594en_US
dc.contributor.affiliationotherDepartment of Chemistry, University of Southern California, Los Angeles, CA 99089, USA, Fax: (+1) 213-740-8594en_US
dc.contributor.affiliationotherDepartment of Chemistry, University of Southern California, Los Angeles, CA 99089, USA, Fax: (+1) 213-740-8594en_US
dc.contributor.affiliationotherDepartment of Chemistry, University of Southern California, Los Angeles, CA 99089, USA, Fax: (+1) 213-740-8594en_US
dc.contributor.affiliationotherDepartment of Electrical Engineering, Princeton University, Princeton, NJ 08544, USAen_US
dc.contributor.affiliationotherUniversal Display Corporation, Ewing, NJ 08618, USAen_US
dc.contributor.affiliationotherUniversal Display Corporation, Ewing, NJ 08618, USAen_US
dc.contributor.affiliationotherUniversal Display Corporation, Ewing, NJ 08618, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/55937/1/1127_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/ange.200604240en_US
dc.identifier.sourceAngewandte Chemieen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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