A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures
dc.contributor.author | Allard, Lawrence F. | en_US |
dc.contributor.author | Bigelow, Wilbur C. | en_US |
dc.contributor.author | Jose-Yacaman, Miguel | en_US |
dc.contributor.author | Nackashi, David P. | en_US |
dc.contributor.author | Damiano, John | en_US |
dc.contributor.author | Mick, Stephen E. | en_US |
dc.date.accessioned | 2009-03-03T20:08:31Z | |
dc.date.available | 2010-04-14T17:40:05Z | en_US |
dc.date.issued | 2009-03 | en_US |
dc.identifier.citation | Allard, Lawrence F.; Bigelow, Wilbur C.; Jose-Yacaman, Miguel; Nackashi, David P.; Damiano, John; Mick, Stephen E. (2009). "A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures." Microscopy Research and Technique 72(3): 208-215. <http://hdl.handle.net/2027.42/61867> | en_US |
dc.identifier.issn | 1059-910X | en_US |
dc.identifier.issn | 1097-0029 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/61867 | |
dc.identifier.uri | http://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=19165742&dopt=citation | en_US |
dc.description.abstract | In recent years, an increasing number of laboratories have been applying in situ heating (and ultimately, gas reaction) techniques in electron microscopy studies of catalysts and other nanophase materials. With the advent of aberration-corrected electron microscopes that provide sub-ÅngstrÖm image resolution, it is of great interest to study the behavior of materials at elevated temperatures while maintaining the resolution capabilities of the microscope. In collaboration with Protochips Inc., our laboratory is developing an advanced capability for in situ heating experiments that overcomes a number of performance problems with standard heating stage technologies. The new heater device allows, for example, temperature cycling from room temperature to greater than 1000°C in 1 ms (a heating rate of 1 million Centigrade degrees per second) and cooling at nearly the same rate. It also exhibits a return to stable operation (drift controlled by the microscope stage, not the heater) in a few seconds after large temperature excursions. With Protochips technology, we were able to demonstrate single atom imaging and the behavior of nanocrystals at high temperatures, using high-angle annular dark-field imaging in an aberration-corrected (S)TEM. The new capability has direct applicability for remote operation and (ultimately) for gas reaction experiments using a specially designed environmental cell. Microsc. Res. Tech., 2009. © 2009 Wiley-Liss, Inc. | en_US |
dc.format.extent | 513067 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.publisher | Wiley Subscription Services, Inc., A Wiley Company | en_US |
dc.subject.other | Life and Medical Sciences | en_US |
dc.subject.other | Cell & Developmental Biology | en_US |
dc.title | A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Science (General) | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.contributor.affiliationother | Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 ; Materials Science and Technology Division, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37831-6064, USA | en_US |
dc.contributor.affiliationother | Department of Chemical Engineering, The University of Texas at Austin, Austin, Texas 78712 | en_US |
dc.contributor.affiliationother | Protochips Inc., 840 Main Campus Drive, Suite 3500, Raleigh, North Carolina 27606 | en_US |
dc.contributor.affiliationother | Protochips Inc., 840 Main Campus Drive, Suite 3500, Raleigh, North Carolina 27606 | en_US |
dc.contributor.affiliationother | Protochips Inc., 840 Main Campus Drive, Suite 3500, Raleigh, North Carolina 27606 | en_US |
dc.identifier.pmid | 19165742 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/61867/1/20673_ftp.pdf | |
dc.identifier.doi | 10.1002/jemt.20673 | en_US |
dc.identifier.source | Microscopy Research and Technique | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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