Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials
dc.contributor.author | Tian, H. H. | en_US |
dc.contributor.author | Atzmon, Michael | en_US |
dc.date.accessioned | 2011-03-31T20:58:53Z | |
dc.date.accessioned | 2011-03-31T20:58:53Z | |
dc.date.available | 2011-03-31T20:58:53Z | en_US |
dc.date.issued | 1999 | en_US |
dc.identifier.citation | H. H. Tian and M. Atzmon, M. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, "Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials," 79, 1769 (1999). <http://hdl.handle.net/2027.42/83400> | en_US |
dc.identifier.issn | 1460-6992 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/83400 | |
dc.publisher | Taylor & Francis, Ltd. | en_US |
dc.rights | © 1999 Taylor & Francis, Ltd. | en_US |
dc.title | Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Materials Science and Engineering | en_US |
dc.subject.hlbsecondlevel | Nuclear Engineering and Radiological Sciences | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Materials Science and Engineering; Nuclear Engineering and Radiological Sciences | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/83400/1/Tian_PhiMag_1999.pdf | |
dc.identifier.source | "Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties" | en_US |
dc.owningcollname | Nuclear Engineering and Radiological Sciences, Department of (NERS) |
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