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Non-destructive characterization of structural hierarchy within aligned carbon nanotube assemblies
dc.contributor.authorVerploegen, Ericen_US
dc.contributor.authorHart, A. Johnen_US
dc.contributor.authorDe Volder, Michaelen_US
dc.contributor.authorTawfick, Samehen_US
dc.contributor.authorChia, Khek-Khiangen_US
dc.contributor.authorCohen, Robert E.en_US
dc.date.accessioned2013-07-03T19:31:38Z
dc.date.available2013-07-03T19:31:38Z
dc.date.issued2011-05-01en_US
dc.identifier.citationVerploegen, Eric; Hart, A. John; De Volder, Michael; Tawfick, Sameh; Chia, Khek-Khiang; Cohen, Robert E. (2011). "Non-destructive characterization of structural hierarchy within aligned carbon nanotube assemblies." Journal of Applied Physics, 109(9): 94316. <http://hdl.handle.net/2027.42/98714>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/98714
dc.publisherThe American Institute of Physicsen_US
dc.subjectCarbon Nanotubesen_US
dc.subjectChemical Vapour Depositionen_US
dc.subjectDensificationen_US
dc.subjectNanofabricationen_US
dc.subjectNondestructive Testingen_US
dc.subjectSelf-assemblyen_US
dc.subjectThin Filmsen_US
dc.subjectX-ray Scatteringen_US
dc.titleNon-destructive characterization of structural hierarchy within aligned carbon nanotube assembliesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/98714/1/JApplPhys_109_094316.pdf
dc.identifier.doi10.1063/1.3584759en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.owningcollnamePhysics, Department of


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