Deep Blue: Browsing by Title

MDT data quality assessment at the Calibration Centres for the ATLAS experiment at LHC

Verducci, Monica; Camillocci, Elena Solfaroli; Consorti, Valerio (2010-04)

(816.6KB)

The mdx-amplification-resistant mutation system assay, a simple and rapid polymerase chain reaction-based detection of the mdx allele

Amalfitano, Andrea; Chamberlain, Jeffrey S. (John Wiley & Sons, Inc., 1996-12)

(511.3KB)

Me Tools: Redefining Journaling

Tulis, Rebecca (2012)

(7.1MB)

Me, You, and the Missing Elephant

Yang, Lena (2020)

(276.4KB)

ME250 Project Redesign

Gussenbauer, Leah; Klosek, Stephanie; Liang, Christopher; Oldham, Stephen (2009-04)

(6.7MB)

(234.1KB)

Mea Culpa: Formal Education and the Dis-Integrated World

Coppola, Brian P.; Daniels, Douglas S. (Kluwer Academic Publishers; Springer Science+Business Media, 1998-01)

(845.7KB)

Meal Composition Effects on the Oral Bioavailability of Indinavir in HIV-Infected Patients

Zhou, Simon Yuji; Carver, Peggy L.; Fleisher, David; Kaul, Daniel; Kazanjian, Powel H.; Li, Cheng (Kluwer Academic Publishers-Plenum Publishers; Plenum Publishing Corporation ; Springer Science+Business Media, 1999-05)

(1.1MB)

The Mean and Scatter of the Velocity Dispersion-Optical Richness Relation for maxBCG Galaxy Clusters

Becker, M. R.; McKay, Timothy A.; Koester, Benjamin P.; Wechsler, Risa H.; Rozo, E.; Evrard, August E.; Johnston, D.; Sheldon, E. S.; Annis, James; Lau, E.; Nichol, Robert C.; Miller, Christopher J. (Univ Chicago Press, 2007-11-01)

(1.6MB)

The mean and standard deviation of the distribution of group assembly sums

Dwyer, Paul S. (Paul Sumner) (Springer-Verlag; Psychometric Society, 1964-12)

(534.5KB)

Mean and Variance of Coincidence Counting with Deadtime

Yu, Daniel F.; Fessler, Jeffrey A. (Elsevier, 2002-03-28)

(196.3KB)

Mean and Variance of Implicitly Defined Biased Estimators (Such as Penalized Maximum Likelihood) : Applications to Tomography

Fessler, Jeffrey A. (IEEE, 1996-03)

(1.4MB)

Mean and Variance of Photon Counting with Deadtime

Yu, Daniel F.; Fessler, Jeffrey A. (IEEE, 1999-10-24)